http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2642
Outgoing Links
| Predicate | Object |
|---|---|
| concordantIPC | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| level | 9^^<http://www.w3.org/2001/XMLSchema#integer> |
| symbol | G01R31/2642 |
| modified | 2013-01-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| title | Testing semiconductor operation lifetime or reliability, e.g. by accelerated life tests |
| type | http://data.epo.org/linked-data/def/cpc/SubGroup |
| broader | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-26 |
Incoming Links
Total number of triples: 418.