http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-6870378-B1

Outgoing Links

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assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_2a6a9431aa1fe5109ca95ad4e332231b
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2642
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
filingDate 2002-05-16-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2005-03-22-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a7bf6828bdcad8ac36349e8f736395c0
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e98891a26c7fe581196d49b66fbf3e5c
publicationDate 2005-03-22-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-6870378-B1
titleOfInvention Test apparatus and method for reliability assessment of high power switching devices
abstract A test apparatus and method is provided for dynamic thermal and electrical fatigue testing of a semiconductor in an operating environment, such as air, that mimic thermal and electrical stress in the semiconductor during high power switching in the operating environment. Comparisons of pre- and post-testing electrical measurements, i.e., current, voltage and contact resistance, are combined to provide an indicator or long-term reliability.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2014132220-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9312577-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10551423-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9152517-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-104316771-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-103543397-B
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-103543397-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-104316771-B
priorityDate 2002-05-16-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

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http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID457698762

Total number of triples: 23.