http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2012037277-A

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assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c186e9ae8cafab5df5c8d80cfa7b0fa1
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-1608
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2642
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01K7-01
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
filingDate 2010-08-04-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f2fc9f6fba9662144da27cb7175888ec
publicationDate 2012-02-23-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2012037277-A
titleOfInvention Temperature rising device and temperature rising test method
abstract A temperature-raising device that is small and inexpensive, can be easily controlled, and can be applied to a temperature-raising test at a high temperature exceeding the temperature limit of a semiconductor device made of silicon, and the temperature-raising device The temperature rising test method used is provided. A power supply voltage is applied from an external DC power supply to a drain electrode of a MOSFET made of silicon carbide (SiC), and a variable bias voltage generated from the applied power supply voltage is applied to a gate electrode. As a result, the MOSFET 10 is heated. With respect to the voltage obtained by dividing the power supply voltage by the resistors R3 and R4, the change in the voltage obtained by dividing the power supply voltage by the resistors R1 and R2 is amplified by the MOSFET 20 with a predetermined negative amplification factor, and the drain electrode 21 Is added, the voltage of the drain electrode 21 becomes constant, and the bias voltage is kept constant. [Selection] Figure 1
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-113466649-A
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http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-113391180-B
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-113391180-A
priorityDate 2010-08-04-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2010056005-A
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Total number of triples: 20.