| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_36333273e27f0db23ddddbf80ba79ba7
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_058e20842595466045b43f3e7e25d945 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y02E10-50
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H02S50-00 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2642
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H02S50-10
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2605 |
| classificationIPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H02S50-00 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H02S50-10
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R27-08 |
| filingDate |
2012-12-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
2017-06-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_30fb55910e9b00b76a7424b7ffae4247
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_014a83e3bbd4570764527b4405184fc0 |
| publicationDate |
2017-06-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-9689912-B2 |
| titleOfInvention |
Rapid analysis of buffer layer thickness for thin film solar cells |
| abstract |
A method and apparatus for measuring thickness of a film in a solar cell provides for directing light emitted at multiple emission wavelengths, to a surface of the solar cell. Each emission results in the generation of a responsive photo current. The photo currents are read by a current meter having one contact coupled to a surface of the solar cell and another contact coupled to another surface. The currents associated with each of the different light emissions are identified and the thickness of a film in the solar cell is calculated based on the two currents or associated quantum efficiencies, and associated absorption coefficients. In one embodiment, the film thickness is the thickness of a CdS or other buffer film in a thin film solar cell. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11095834-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2019199942-A1 |
| priorityDate |
2012-12-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |