http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-114740320-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_9b15ef10fb1c02e676557d7ec76d9d79 |
| classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y02E10-50 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2642 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 2020-12-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5f6125a3fd11d6e177f16b9653e0ff6c http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_7787c304f6c3cdae5ea85f84962ff7d6 |
| publicationDate | 2022-07-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | CN-114740320-A |
| titleOfInvention | Test method and test system for current capability of polysilicon |
| abstract | The present invention relates to a method and a testing system for testing the current capability of polysilicon. The method includes: acquiring multiple samples of polysilicon with different widths; adjusting the temperature of the samples to a preset temperature, and testing the resistance of each sample at the preset temperature The preset temperature is the sum of the upper limit value of the expected application temperature of polysilicon and the upper limit value of Joule heat of polysilicon; adjust the temperature of the sample to the upper limit value of the expected application temperature, and apply current to the samples respectively, and obtain the samples to reach their respective values. The current values corresponding to the resistance values; take each current value as the maximum RMS current density, and substitute it into the maximum RMS current density model to calculate the empirical parameters of the maximum RMS current density model; substitute the width of the polysilicon into the maximum RMS current density model. In the root current density model, the maximum root mean square current density is calculated as the maximum safe current. The invention does not need special testing equipment, has strong operability and short testing period. |
| priorityDate | 2020-12-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419578708 |
Total number of triples: 14.