http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DE-102017123288-B4

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filingDate 2017-10-06-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2019-11-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_7cdf8719d6679935635ca81a890fa228
publicationDate 2019-11-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber DE-102017123288-B4
titleOfInvention Apparatus and method for testing electronic components
abstract Apparatus (100, 200, 300, 400, 500) for testing electronic components, comprising: - an irradiation bell (110, 210, 310, 410, 510) adapted to exclude a portion (21) of an electronic assembly (20) to be slipped over an electronic component (1) of the assembly and thereby form an evacuable irradiation chamber (111), wherein the irradiation bell at its edge to be applied comprises a compressible seal (112, 212, 312, 412, 512); inside the irradiation bell arranged particle radiation source (120, 220, 320, 420, 520) for nuclear particles; and - a port (130, 330, 430, 530, 630) adapted to be connected to a vacuum pump for evacuating the irradiation chamber (111), the nuclear particles comprising protons and / or alpha radiation and / or Cleavage ions heavier than helium nuclei.
priorityDate 2017-10-06-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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