http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20130034708-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_3577aabfd75e2433ded3fe015c228cb5 |
| classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L22-30 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H04N7-18 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2642 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2635 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2862 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-02 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66 |
| filingDate | 2011-09-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_00644d690bb01773b1361f02f85468f1 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_4e95d80f34331493b5cc73367c216eaa http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_d977bc4a8ed1c7809b3eafccf5eb9c34 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c9cca5af6a26a9e0943770b26fc0d149 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c11394932af86edf59522295f73f53f2 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_90a72f1f3bdf36dcdfb383eb87141235 |
| publicationDate | 2013-04-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | KR-20130034708-A |
| titleOfInvention | Light emitting diode inspection device and method |
| abstract | An object of the present invention is to provide a light emitting diode inspection device and method that can be confirmed in a short time by applying a vacuum shock to the light emitting diode to determine the adhesion between the materials used for manufacturing the light emitting diode package and the deformation of the light emitting diode package. To this end, the input unit for detecting the inspection information including the vacuum setting information for the inspection of the light emitting diode of the light emitting diode, the vacuum holding time information, and selection information for confirming whether or not to store the image signal; A controller for outputting an inspection vacuum control signal and an inspection time control signal of the light emitting diode according to the inspection information detected from the input unit; A vacuum pump operative to generate the vacuum pressure according to a vacuum pressure control signal output from the controller; And a chamber in which a test light emitting diode is accommodated, and a vacuum pressure is generated or the generated vacuum pressure is released according to the operation of the vacuum pump. Therefore, by applying a vacuum shock to the light emitting diode, there is an advantage that can be confirmed in a short time by checking the adhesion between the materials used for manufacturing the light emitting diode package and whether the light emitting diode package is denatured. |
| priorityDate | 2011-09-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 29.