http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101237896-B1
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c5d6c3e63bb2a6570399b047a1e864b1 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2863 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-0441 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2886 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2879 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2642 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-06755 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-067 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 2012-02-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2013-02-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9d624816dc30865297164415ea9b2d0a http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_61b66f91acc92d937b93e4e6c08900f3 |
| publicationDate | 2013-02-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | KR-101237896-B1 |
| titleOfInvention | Contactor for testing semiconductor devices with antistatic function |
| abstract | The present invention relates to a semiconductor device test contactor provided between a terminal of a semiconductor device and an inspection circuit board for testing the failure of the semiconductor device and relaying an electrical connection between the terminal of the semiconductor device and the inspection circuit board. . The contactor for testing a semiconductor device according to the present invention comprises: an insulating body formed by mixing a first material of an insulating material and a second material of an antistatic material and having a plurality of conductive pattern holes penetrated in the vertical direction; Each conductive pattern hole of the insulating body may include a conductive pattern portion of a conductive material electrically connecting the semiconductor device and the test circuit board. Accordingly, the main body is formed by mixing the first material of the insulating material and the second material of the antistatic material, thereby minimizing the generation of static electricity in the main body. |
| priorityDate | 2011-11-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 29.