http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101110002-B1

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filingDate 2011-06-22-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2012-01-31-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_65281e3014d56f6c3d0df06e83df7620
publicationDate 2012-01-31-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-101110002-B1
titleOfInvention Elastic contactor for semiconductor device test and manufacturing method
abstract The present invention relates to a semiconductor device test contactor, and more particularly, to minimize the gap between the conductive parts of the contactor and to have an indirect contact method when the semiconductor device terminal is in contact with the test circuit board to prevent contamination and damage of the mixed conductive parts. As a result, the lifespan and precision of the contactor can be remarkably improved, and the contactor manufacturing method can be manufactured in various shapes and sizes without the need for additional injection molds, investment properties, and additional components. The present invention relates to an elastic contactor for testing a semiconductor device and a method of manufacturing the same, which can reduce the unit cost and facilitate the reduction of the spacing.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20180103450-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2018182327-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101237896-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101949844-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20180031106-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101895002-B1
priorityDate 2011-06-22-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 32.