| abstract |
Component testing apparatus for testing e.g. magnetic bubble memories at various predetermined temperatures includes a chamber comprising an upper part and a lower part 16, arranged to make in thermal contact, with, in use a component sandwiched between them and the upper part in contact with a heat source or sink 22. Electric components, e.g. buffer amplifiers 34, a pulse generator 35, sense amplifier 36 and digitizer 37 are mounted adjacent to, but insulated from, the chamber, electric contact being effected via a circuit board 32. The upper part of the chamber includes a recess for a temperature sensor. <IMAGE> |