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filingDate 2007-02-23-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2010-12-14-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_581e7af2e81f583e500bdf647de08b4d
publicationDate 2010-12-14-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-7851237-B2
titleOfInvention Semiconductor device test structures and methods
abstract Semiconductor device test structures and methods are disclosed. In a preferred embodiment, a test structure includes a feed line, a stress line disposed proximate the feed line, and a conductive feature disposed between the stress line and the feed line. The test structure includes a temperature adjuster proximate at least the conductive feature, and at least one feedback device coupled to the temperature adjuster and at least the conductive feature.
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