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filingDate 2017-02-09-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2019-05-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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publicationDate 2019-05-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-10295566-B2
titleOfInvention Method of providing a high density test contact solution
abstract A flexible probe card according to the present invention includes a compression layer; a transport layer coupled to the compression layer; and a contact layer coupled to the transport layer. The compression layer is formed of encapsulated closed cell polyurethane foam. The transport layer includes connectors for coupling the flexible probe card to a tester. The contact interface layer includes embedded conductive wires placed in a fixed grid pattern in a silicon rubber layer, without a specific connector pattern associated either with the transport layer or a device under test.
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