http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-275
Outgoing Links
Predicate | Object |
---|---|
concordantIPC | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-27 |
level | 10^^<http://www.w3.org/2001/XMLSchema#integer> |
symbol | G01R31/275 |
modified | 2013-01-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
title | Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects surrounding elements for testing individual semiconductor components within integrated circuits |
type | http://data.epo.org/linked-data/def/cpc/SubGroup |
broader | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-27 |
Incoming Links
Total number of triples: 136.