http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DE-4340226-A1

Outgoing Links

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assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_fbd7063eee731fa36db57b14b15418d3
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-32
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76202
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76205
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-763
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-32
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-762
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-763
filingDate 1993-11-25-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_eb60e8e6b26c46db560c4aaa2492c55d
publicationDate 1995-06-01-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber DE-4340226-A1
titleOfInvention Component with isolation region structure and method for producing the same
abstract Semiconductor element comprises: (a) several trenches with narrow (51a,51b) and wide (51c,51d) trenches formed in the Si substrate (41); (b) a 1st insulating film (53) formed on the base surface and the oppositely lying side surfaces of each narrow trench and each wide trench, and having small thickness; (c) a 2nd insulating film (59) formed on the base of each wide trench and having large thickness; (d) a semiconducting film (61) filled in the trenches; (e) a 3rd insulating film (43) formed over the active regions of low thickness; and (f) a 4th insulating film (63) formed over the semiconducting film of low thickness. Prodn. of the element is also claimed.
priorityDate 1993-11-25-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

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Total number of triples: 23.