http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-S6314421-A

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assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_be055db3c1a09879df07379ba969e223
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-302
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-31
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-3065
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-205
filingDate 1986-07-07-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_fd6955ee47e44cfd23353867a1fe5f06
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_08943a387f16df8cdbea600bf59dd6e3
publicationDate 1988-01-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-S6314421-A
titleOfInvention Plasma chemical vapor deposition method
abstract PURPOSE: To perform a plasma cleaning operation on the ineffective film adhered to the component parts in the vacuum chamber of a plasma CVD device in an excellent reproducible manner by a method wherein said plasma cleaning operation is performed while the light-emission spectrum intensity of the specific atoms or molecules is being monitored. n CONSTITUTION: When a plama cleaning operation is performed on the component parts in the reaction chamber 41 of a plasma CVD device, the intensity of the light-emission spectrum of specific atoms or molecules is to be monitored simultaneously. For example, a silicon nitride film is formed on the surface of a sample 42 using the plasma CVD device, and after the sample 42 has been picked out from the vacuum chamber 41, the vacuum chamber 41 is evacuated, SF 6 gas is introduced from a gas flow-rate controlling device 47 and low temperature plasma is generated. Also, a plasma light is introduced to a spectroscope 54 from a window 52, the nitride atoms of wavelength of 674 nm are monitored by a detector 56, they are introduced to a recording meter through the intermediary of an amplifier 57. Then, when the light-emission spectrum density is deteriorated to the prescribed value, the plasma cleaning operation is finished. n COPYRIGHT: (C)1988,JPO&Japio
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http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-WO2008050596-A1
priorityDate 1986-07-07-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID3084099
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Total number of triples: 34.