| abstract |
The invention relates to a method for analyzing of determining thenmethylation pattern of a starting DNA and/or for distinguishing betweennmethylated and non-methylated sites in the starting DNA, comprising at leastn (A) generating a first DNA fingerprint, containing bands corresponding tonboth the methylated and non-methylated sites of interest; and/or (B) generating a second DNA fingerprint, containing bands correspondingnonly to the methylated sites of interest; nand optionally comprising (C) generating a third DNA fingerprint, containing bands corresponding onlynto the non-methylated sites of interest; nand optionally further comprising (D) analysing the fingerprint(s) thus obtained. n Said fingerprints are preferably generated using AFLP, by means of anfrequent cutter and a methylation sensitive rare cutter. n The invention further relates to specific methods for generating the abovenfirst and second DNA fingerprint by means of AFLP, and kits for use with saidnmethods. |