reference/205238646

http://rdf.ncbi.nlm.nih.gov/pubchem/reference/205238646

Outgoing Links

Predicate	Object
contentType	Journal Article
endingPage	449
issn	0735-9640 1572-9818
issueIdentifier	5-6
pageRange	436-449
publicationName	Plant Molecular Biology Reporter
startingPage	436
hasFundingAgency	http://rdf.ncbi.nlm.nih.gov/pubchem/organization/MD5_e117d70fc4442394ff265df0218a7107 http://rdf.ncbi.nlm.nih.gov/pubchem/organization/MD5_d67f7d1f747f2c695359bc44df882dfc http://rdf.ncbi.nlm.nih.gov/pubchem/organization/MD5_487baf6554eb36bb22c6138d90a7c50f http://rdf.ncbi.nlm.nih.gov/pubchem/organization/MD5_8091c69f3750534ecd4fc28a1f1c5063
bibliographicCitation	Jiang C, Xiao S, Li D, Chen L, Zhong Q, Yin F, Yu T, Ke X, Zhang D, Fu J, Chen Y, Wang B, Wang L, Li E, Zhang Y, Huang X, Cheng Z. Identification and Expression Pattern Analysis of Bacterial Blight Resistance Genes in Oryza officinalis Wall ex Watt Under Xanthomonas oryzae Pv. oryzae Stress. Plant Molecular Biology Reporter. 2019 Nov 15;37(5-6):436–49. doi: 10.1007/s11105-019-01164-3.
creator	http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_18bf7344b4dd67eb904d2eb4265414ec http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_cea9acca3401ec14944bae8c410e4574 http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_9e894c8a2c4c9b1f25b421495166ec5a http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_5dad5212398b8574fed5c7489ae78d8a http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_9137fe389d3788dfc8786b5f58f9a09a http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_a81f096199433fa8b6c8046586a242ed http://rdf.ncbi.nlm.nih.gov/pubchem/author/ORCID_0000-0002-6897-1255 http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_ebb8a027b115ceaf2d65d9d8b1b75abc http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_f91102ce7db02f0fcb588f44a3a55bbf http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_9e065ec6331a195ecfd0ffc15d7569c9 http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_3ba31e1394eeadb1a79081b52dfaf59c http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_d182fb6403bdea7a4466a81baa3f74b9 http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_01ebbaca9ee6433b6958cc3126686124 http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_bd2b3180a6abd18113a087899eaad05c http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_2b34b726bb945bf0ec6e1ebd4523feda http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_b93c2f4a28757ad0beabc9e0aa62348c http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_07c92ce4893e76731620bd5f2594b21e
date	2019-11-15-04:00^^<http://www.w3.org/2001/XMLSchema#date>
identifier	https://doi.org/10.1007/s11105-019-01164-3
isPartOf	https://portal.issn.org/resource/ISSN/0735-9640 https://portal.issn.org/resource/ISSN/1572-9818 http://rdf.ncbi.nlm.nih.gov/pubchem/journal/8503
language	English
source	https://www.crossref.org/ https://scigraph.springernature.com/
title	Identification and Expression Pattern Analysis of Bacterial Blight Resistance Genes in Oryza officinalis Wall ex Watt Under Xanthomonas oryzae Pv. oryzae Stress

Total number of triples: 39.