| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_23d994b3d26382b3031313e93e543007
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_5efbd16422b99c9a37eb658658103e13
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_f493fd6fdb0c6c5adef5f1b7845df792
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_a9d8f37b1b9271f00830971a1e305191 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J2237-0812 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76826
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76829
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76825
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76867
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76849
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76832
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76828 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-768 |
| filingDate |
2008-09-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f8e82f72fda8a01b340901281a61c01c
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5e88c7e9961145bfff391953cd9fef11
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_733f6eeaa315945e61163cd0cc87e64c |
| publicationDate |
2009-04-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
WO-2009042443-A1 |
| titleOfInvention |
Method to improve electrical leakage peformance and to minimize electromigration in semiconductor devices |
| abstract |
Embodiments of methods for improving electrical leakage performance and minimizing electromigration in semiconductor devices are generally described herein. |
| priorityDate |
2007-09-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |