| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_3711ac07849806cff2dd5e729a9599d1
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_385cad70ff310f770a9c98ad42b1c544
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_669d8ae1cf70106d46e3e20b3781426f
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_1af8df51ce24ca931ae718fb747f6aa0 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G03G5-142
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G03G5-14
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G03G5-144
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G03G5-102 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G03G5-04 |
| filingDate |
2010-09-03-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
2014-07-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_49d4395792ac23cc2ea32b19635d395e
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3c514ccc9bf1c64faf4374bb07bfef21
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9db4e16f47be00de57168ebe48890d97 |
| publicationDate |
2014-07-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-8778580-B2 |
| titleOfInvention |
Electrophotographic photosensitive member, process cartridge, and electrophotographic apparatus |
| abstract |
An electrophotographic photosensitive member having a specific conductive layer and promising less variation in light-area potential and residual potential in reproducing images repeatedly, and a process cartridge and an electrophotographic apparatus which have such an electrophotographic photosensitive member are provided. Where a test in which a voltage of −1.0 kV having only a DC voltage component is continuously applied to the conductive layer for 1 hour is conducted, the conductive layer has volume resistivity satisfying the following mathematical expressions (1) and (2), as values before and after the test:n n−2.00≦(log|ρ 2 |−log|ρ 1 |)≦2.00 (1), andn n1.0×10 8 ≦ρ 1 ≦2.0×10 13 (2),n nwhere, in the expressions (1) and (2), ρ 1 is volume resistivity (Ω·cm) of the conductive layer as measured before the test and ρ 2 is volume resistivity (Ω·cm) of the conductive layer as measured after the test. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9372419-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9372418-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9772569-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2014269046-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10203617-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9372417-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10162278-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10303085-B2 |
| priorityDate |
2009-09-04-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |