http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-4798958-A

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classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L27-148
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L27-148
filingDate 1987-03-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 1989-01-17-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2b16bb2e075d69a27514e997076590ac
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_05a5bd7007939b5ff79ffe432da4b918
publicationDate 1989-01-17-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-4798958-A
titleOfInvention CCD imaging sensors
abstract A method for promoting quantum efficiency (QE) of a CCD imaging sensor for UV, far UV and low energy x-ray wavelengths by overthinning the back side beyond the interface between the substrate and the photosensitive semiconductor material, and flooding the back side with UV prior to using the sensor for imaging. This UV flooding promotes an accumulation layer of positive states in the oxide film over the thinned sensor to greatly increase QE for either frontside or backside illumination. A permanent or semipermanent image (analog information) may be stored in a frontside SiO 2 layer over the photosensitive semiconductor material using implanted ions for a permanent storage and intense photon radiation for a semipermanent storage. To read out this stored information, the gate potential of the CCD is biased more negative than that used for normal imaging, and excess charge current thus produced through the oxide is integrated in the pixel wells for subsequent readout by charge transfer from well to well in the usual manner.
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priorityDate 1984-08-20-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 37.