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filingDate 2018-04-23-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2021-04-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0c633fbac8e82f01a241d2d66facd674
publicationDate 2021-04-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber TW-I725304-B
titleOfInvention Film forming method
abstract The object of the present invention is to provide a method for forming a silicon oxide film that does not use hydrogen-containing gas but can stably generate oxygen plasma, and can form a silicon oxide film with good uniformity in the surface of the film.n n n A film forming method for forming a silicon oxide film on the surface of a substrate with a recessed pattern is provided. The method includes: adsorbing aminosilane gas on the surface of the substrate containing the recessed pattern; and supplying an oxidizing gas to the surface of the substrate containing the recessed pattern. The step of oxidizing the aminosilane gas adsorbed on the surface of the substrate on the surface of the substrate of the recessed pattern so that a silicon oxide film layer is deposited on the surface of the substrate containing the recessed pattern; and by The plasma activates the mixed gas containing oxygen, argon, and nitrogen and supplies it to the silicon oxide film layer to perform the process of reforming the silicon oxide film layer.
priorityDate 2017-04-25-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 47.