http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20170142926-A

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filingDate 2017-06-19-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_6bb8561798ca6c9749388b74071b992a
publicationDate 2017-12-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-20170142926-A
titleOfInvention Method of manufacturing semiconductor device, and semiconductor manufacturing apparatus
abstract The present invention relates to a process for forming a silicon film by supplying a film forming gas containing silicon to an object to be processed having a concave portion formed on its surface and filling the concave portion with silicon to prevent formation of voids and formation of voids in the silicon layer And to provide a technology that can do this. The film forming gas is supplied to the object to be processed (wafer W), and the silicon film 44 is formed in the concave portion 42 on the surface of the object to be processed. Subsequently, a process gas containing a halogen gas for etching the silicon film 44 and a roughness suppressing gas for suppressing the roughness of the surface of the silicon film 44 after etching by the halogen gas is supplied to the object to be processed And the silicon film 44 formed on the sidewall of the recess 42 is etched to expand the opening width of the recess 42. As a result, After that, a film forming gas is supplied to the object to be processed, and silicon is deposited on the silicon film remaining in the recess 42 to fill the silicon.
priorityDate 2016-06-20-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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