http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101190074-B1

Outgoing Links

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classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-28008
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-306
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-4763
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-66795
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-785
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-32137
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-3065
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-78
filingDate 2008-08-26-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2012-10-11-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 2012-10-11-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-101190074-B1
titleOfInvention Method for manufacturing semiconductor device
abstract The manufacturing method of a semiconductor device comprises the process of forming the insulating layer of the protrusion shape which has a surface and the rising surface which rises upwards from this surface on a semiconductor substrate, and forms a conductive layer so that the insulating layer of a protrusion shape may be covered. And patterning and removing a predetermined region of the conductive layer by an etching process using a microwave plasma using microwave as a plasma source while applying a bias power of 70 mW / cm 2 or more to a semiconductor substrate under a high pressure condition of 85 mTorr or higher. It includes.
priorityDate 2007-08-31-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2002261043-A
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID457707758
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID24261

Total number of triples: 20.