http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2017130659-A

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filingDate 2017-01-17-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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publicationDate 2017-07-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2017130659-A
titleOfInvention Control of RF amplitude of edge ring of capacitively coupled plasma processing equipment
abstract Since the edge ring is exposed to plasma in the processing chamber, the edge ring erodes and the eroded edge ring is replaced, causing processing downtime and at the same time increasing the cost of consumable parts. An electrostatic chuck 229 includes an annular electrode 139 coupled to ground via a variable capacitor. The ring-shaped electrode 139 can have a ring shape and can be embedded in the substrate support including the electrostatic chuck 229. The ring-shaped electrode 139 can be disposed under the periphery of the substrate 109 and / or the edge ring 242. As the plasma sheath 245 is lowered adjacent to the edge ring 242 by erosion of the edge ring 242, the capacitance of the variable capacitor is adjusted to affect the RF amplitude near the edge of the substrate 109. Adjustment of the RF amplitude via the ring electrode 139 and the variable capacitor results in adjustment of the plasma sheath near the periphery of the substrate. [Selection] Figure 2B
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priorityDate 2016-01-22-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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Total number of triples: 46.