http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2009267111-A

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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-3065
filingDate 2008-04-25-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c4d4bc316bd12b6662a44957e1fe3812
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_124605f184cacf24d1ec01748a229026
publicationDate 2009-11-12-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2009267111-A
titleOfInvention Semiconductor device manufacturing method, manufacturing apparatus, computer program, and computer-readable storage medium
abstract A semiconductor device manufacturing method capable of adjusting the size of a portion whose size is to be controlled, and a semiconductor device manufacturing apparatus suitable for the method. The disclosed semiconductor device manufacturing method includes a dimension measuring step S8 for measuring a dimension of a part whose dimension is to be controlled; whether or not a measured value obtained in the dimension measuring step S8 is larger than a reference value. Determination steps S9 and S11 for determination; and a first step for reducing the part when the measurement value is determined to be larger than the reference value in the determination steps S9 and S11, and the measurement value is smaller than the reference value in the determination step A dimension adjustment step of performing any one of the second step of increasing the region when it is determined that [Selection] Figure 1
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-7169866-B2
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priorityDate 2008-04-25-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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