http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2009238772-A

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filingDate 2008-03-25-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_d0c8b6e31ce8272a6acba47bceff3f7a
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publicationDate 2009-10-15-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2009238772-A
titleOfInvention Epitaxial substrate and method for manufacturing epitaxial substrate
abstract An epitaxial substrate capable of reducing variation in In composition in an active layer by using a GaN substrate having variation in off-angle within the substrate surface, and a method for manufacturing the epitaxial substrate are provided. An epitaxial substrate includes a GaN substrate having a principal surface that is inclined with respect to a c-plane or a -c-plane of a GaN crystal, and an InGaN well layer a provided on the principal surface of the GaN substrate. And an active layer 23. The central value of the distribution of angles (off angles) between the c-plane or -c-plane and the main surface 10a in the plane of the main surface 10a is in the range of 15 ° to 60 °, and is in the plane of the main surface 10a. The difference between the maximum value and the minimum value of the off-angle is 0.3 ° or more. [Selection] Figure 2
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