http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-107240548-A

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filingDate 2017-03-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_45eaefd2fdf66aa40c3a5010b6f5fab5
publicationDate 2017-10-10-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber CN-107240548-A
titleOfInvention Semiconductor device and manufacturing method thereof
abstract The present invention relates to a semiconductor device and its manufacturing method. When a MISFET is formed by using the gate-last process and replacing the dummy gate electrode with a metal gate electrode, both the corresponding cap insulating film and the interlayer insulating film over the control gate electrode and the dummy gate electrode are polished to Overpolishing of the upper surface of the interlayer insulating film and occurrence of pits are prevented. In the gate-last process, an interlayer insulating film is formed to cover the control gate electrode and the dummy gate electrode and the cap insulating film thereon. After the upper surface of the interlayer insulating film is polished so that the cap insulating film is exposed from the interlayer insulating film, etching is performed to selectively remove the cap insulating film. Subsequently, the upper surface of the interlayer insulating film is polished.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-110148582-A
priorityDate 2016-03-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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