http://rdf.ncbi.nlm.nih.gov/pubchem/reference/6782720
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endingPage
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publicationName
Applied Optics
startingPage
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bibliographicCitation
Ji J, Fan W, Gao W, Wang C, Zhang Y, Xu M, Ji F. Investigation of roughness evolution of ion sputtered fused silica surface. Appl Opt. 2019 Jul 10;58(20):5388–96. doi: 10.1364/ao.58.005388. PMID: 31504006.
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date
2019-07-05-04:00
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identifier
https://pubmed.ncbi.nlm.nih.gov/31504006
https://doi.org/10.1364/ao.58.005388
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language
English
source
https://pubmed.ncbi.nlm.nih.gov/
https://www.crossref.org/
title
Investigation of roughness evolution of ion sputtered fused silica surface
Total number of triples:
28
.