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Wen Q, Lin Y, Yang Y, Gao R, Ouyang N, Ding D, Liu Y, Zhai T. In Situ Chalcogen Leaching Manipulates Reactant Interface toward Efficient Amine Electrooxidation. ACS Nano. 2022 Jun 28;16(6):9572–82. doi: 10.1021/acsnano.2c02838. PMID: 35679123. |