http://rdf.ncbi.nlm.nih.gov/pubchem/reference/213341089
Outgoing Links
Predicate
Object
contentType
Journal Article
endingPage
1186
issn
1975-7220
0256-1115
issueIdentifier
9
pageRange
1178-1186
publicationName
Korean Journal of Chemical Engineering
startingPage
1178
bibliographicCitation
Xu H, Li A, Qi Q, Jiang W, Sun Y. Electrochemical degradation of phenol on the La and Ru doped Ti/SnO2-Sb electrodes. Korean Journal of Chemical Engineering. 2012 Mar 24;29(9):1178–86. doi: 10.1007/s11814-012-0014-3.
creator
http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_e1c6823350f2c27f20300cb64fa4eeb2
http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_59ab6a84eaa34530932ac76abff8aa0b
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http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_9559d4454d06f78ab5fd00fdc814cad7
date
2012-03-24-04:00
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http://www.w3.org/2001/XMLSchema#date
>
identifier
https://doi.org/10.1007/s11814-012-0014-3
isPartOf
https://portal.issn.org/resource/ISSN/1975-7220
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http://rdf.ncbi.nlm.nih.gov/pubchem/journal/40356
language
English
source
https://www.crossref.org/
https://scigraph.springernature.com/
title
Electrochemical degradation of phenol on the La and Ru doped Ti/SnO2-Sb electrodes
Total number of triples:
23
.