http://rdf.ncbi.nlm.nih.gov/pubchem/reference/212072785

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contentType Journal Article
endingPage 2597
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pageRange 2591-2597
publicationName Journal of Materials Science: Materials in Electronics
startingPage 2591
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bibliographicCitation Yan X, Ding S, Zhang Y, Song T, Huang L, Zhang X. Structure and microwave dielectric properties of BaAl2−2x(CuSi)xSi2O8 ceramics. Journal of Materials Science: Materials in Electronics. 2020 Jan 20;31(3):2591–7. doi: 10.1007/s10854-019-02798-5.
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date 2020-01-20-04:00^^<http://www.w3.org/2001/XMLSchema#date>
identifier https://doi.org/10.1007/s10854-019-02798-5
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language English
source https://www.crossref.org/
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title Structure and microwave dielectric properties of BaAl2−2x(CuSi)xSi2O8 ceramics

Total number of triples: 27.