| Predicate |
Object |
| contentType |
Journal Article |
| endingPage |
77 |
| issn |
2095-2767
2095-2759 |
| issueIdentifier |
1 |
| pageRange |
73-77 |
| publicationName |
Frontiers of Optoelectronics |
| startingPage |
73 |
| bibliographicCitation |
Min R, Ji R, Yang L. Thermal analysis for fast thermal-response Si waveguide wrapped by SiN. Frontiers of Optoelectronics. 2011 Dec 29;5(1):73–7. doi: 10.1007/s12200-012-0187-8. |
| creator |
http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_1b7646360c694b0bd5e0cb7679502ea9
http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_a3e80e76f44bafdc2c28a7772949538d
http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_f749cfdca0d90dd1b6d4e4932dc98ecc |
| date |
2011-12-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| identifier |
https://doi.org/10.1007/s12200-012-0187-8 |
| isPartOf |
https://portal.issn.org/resource/ISSN/2095-2767
https://portal.issn.org/resource/ISSN/2095-2759
http://rdf.ncbi.nlm.nih.gov/pubchem/journal/52153 |
| language |
English |
| source |
https://www.crossref.org/
https://scigraph.springernature.com/ |
| title |
Thermal analysis for fast thermal-response Si waveguide wrapped by SiN |