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Yang Y, Fu Z, Zhang X, Cui Y, Xu F, Li T, Wang Y. In situ TEM mechanical characterization of one-dimensional nanostructures via a standard double-tilt holder compatible MEMS device. Ultramicroscopy. 2019 Mar;198():43–8. doi: 10.1016/j.ultramic.2018.12.008. PMID: 30641406. |