| abstract |
Provided is a semiconductor device that is capable of multipoint measurement. According to the present invention, a semiconductor device has a first layer and a second layer that is on the first layer. The first layer has a first multiplexer, a second multiplexer, m analog switches that are electrically connected to the first multiplexer (m being an integer that is at least 1), and n analog switches that are electrically connected to the second multiplexer (n being an integer that is at least 1), and the second layer has m×n transistors. Each of the m analog switches is electrically connected to n transistors, and each of the n analog switches is electrically connected to m transistors. |