http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2022220037-A1

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filingDate 2022-03-23-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_da7853ea986fe0ebd47bada553161428
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publicationDate 2022-10-20-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber WO-2022220037-A1
titleOfInvention Substrate processing method, substrate processing device, and drying process liquid
abstract This substrate processing method comprises: a step for supplying a chemical liquid to the surface of a substrate (step S11); a step for supplying a rinse liquid to the surface of the substrate after step S11 (step S12); a step for bringing a drying process liquid that has been heated into contact with the surface of the substrate after step S12 (step S14); and a step for drying the substrate by removing the drying process liquid from the surface of the substrate after step S14 (step S15). The surface tension of the drying process liquid is lower than the surface tension of the rinse liquid. The boiling point of the drying process liquid is higher than the boiling point of the rinse liquid. The temperature of the drying process liquid that comes into contact with the surface of the substrate in step S14 is a prescribed contact temperature that is at least the boiling point of the rinse liquid and is less than the boiling point of the drying process liquid. In this way, it is possible to inhibit pattern collapse during a drying process.
priorityDate 2021-04-16-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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