http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2019060419-A1

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filingDate 2018-09-19-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e696ea557d9fb42ac157271665696b72
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publicationDate 2019-03-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber WO-2019060419-A1
titleOfInvention WELLBORNE COLLECTOR CONNECTION REGION FOR NARROW DEEPENERS
abstract Provided is a method of forming an integrated circuit (IC) which comprises forming a second type doped buried layer (BL) (106) in a first type doped substrate (102) . Deep trenches are etched with narrower inner trench rings and wider outer trench rings to the BL. A first sink sink implantation (122) uses ions of the second type with a first dose, a first energy and a first inclination angle. A second deep sink implantation (182) utilizes ions of the second type with a second dose lower than the first dose, a second energy higher than the first energy, and a second inclination angle smaller than the first inclination angle. The outer trench rings and the inner trench rings are dielectrically coated. The dielectric coating is removed from the bottom of the outer trench rings. The outer trench rings are filled with an electroconductive filler material that contacts the substrate and fills the inner trench rings.
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