http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2017174792-A1
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_46570326040ec3afb9917a7e7799019f |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B21-0036 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B21-0032 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B21-16 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B21-367 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02B21-36 |
| filingDate | 2017-04-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_984b7e68caa7615f2e06cc519bff3f18 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_cfb4a7be53e0ea5e6541469264c44e01 |
| publicationDate | 2017-10-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | WO-2017174792-A1 |
| titleOfInvention | Method and microscope for examining a sample |
| abstract | The invention relates to a method for examining a sample. The method is distinguished by the fact that the sample is illuminated with an illumination light beam in each case simultaneously in a plurality of mutually different sample planes in each case along an illumination line, and wherein each sample region illuminated along an illumination line is scanned in each case with a dedicated detection PSF and the detection light emanating from the illuminated sample regions is detected simultaneously and spatially separately from one another. The invention additionally relates to a microscope, in particular for performing such a method. |
| priorityDate | 2016-04-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 19.