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filingDate 2017-02-16-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2018-02-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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publicationDate 2018-02-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-9905471-B2
titleOfInvention Integrated circuit structure and method forming trenches with different depths
abstract A method includes depositing an ESL on a substrate; patterning the ESL such that a first region of the substrate is covered thereby and a second region of the substrate is exposed within an opening of the etch stop layer; depositing a first dielectric layer on the ESL in the first region and on the substrate in the second region; patterning the first dielectric layer to form a first trench through the first dielectric layer in the first region; forming a metal feature in the first trench; depositing a second dielectric layer over the metal feature in the first region and over the first dielectric layer in the second region; and performing a patterning process to form a second trench through the second dielectric layer in the first region, and to form a third trench through the second and first dielectric layers in the second region.
priorityDate 2016-04-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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