| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_5db3d4f0b463143c87e443a203d14719
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_3bd0224a3748e78794a5c82a0f1b169b
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_0f5df90f7fd1f0c4684995a6def2a340
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_6ebad56d7ded3b73374281c8012d1396 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B01L2200-148
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-41
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-23
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y10S436-805
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-455
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-45 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-77
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-8422
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-253 |
| classificationIPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-23
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-41
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-45 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-84
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-77
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-25 |
| filingDate |
2010-05-05-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
2017-05-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e1f57741c413ff7f53c7bead7f49f574
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b8ee87df08713f8cd0e9f9d1bbd5f832
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a1e4a1b4fec73e77cf1a6c07b117b115 |
| publicationDate |
2017-05-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-9658168-B2 |
| titleOfInvention |
Method and device for determining reflection coefficients on filter arrangements having thin layers |
| abstract |
The invention relates to a method for determining optical properties by measuring intensities on a thin layer, wherein light is irradiated onto a carrier ( 105 ) that has said thin layer and that is at least partially transparent. Interferences on the at least one thin layer are measured as the relative intensity of at least one superpositioned wave, optionally using filter arrangements ( 113, 115, 117 ) provided for this purpose, whereupon the reflection coefficient(s) and/or the transmission coefficient(s) from the reflection and/or the transmission on the thin layer are determined. Preferably, the intensity of at least two superpositioned waves is measured. The light may be irradiated directly onto the carrier. The invention also relates to a device for determining optical properties by measuring intensities on a thin layer, said device comprising an analysis unit which stores at least one lookup table. The method and the device are preferably used in the area of homeland security. |
| priorityDate |
2009-05-05-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |