| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_dc3e639586089fe232d0cfb27383c875
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_ec9ba860531b93052d367089ce4bc09e
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_0d54724ae9e3a5f143a97b8bbddbf295 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2291-0427
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2291-0426
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2291-0423
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2203-0094
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2291-02827
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2291-0256 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N11-16
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N29-036
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06F17-13
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N29-022
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N5-02 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N29-02
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06F17-13
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N29-036
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N11-16
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N5-02 |
| filingDate |
2011-10-18-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
2016-06-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_519d61dae0e73067b8945dd59e43facb
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e37efbaf7a34580745274d090427099b |
| publicationDate |
2016-06-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-9360409-B2 |
| titleOfInvention |
Method for measuring viscoelastic modulus of substance, and apparatus for measuring viscoelastic modulus of substance |
| abstract |
[Problem] A method for measuring a viscoelastic modulus of a substance and an apparatus for measuring the viscoelastic modulus of the substance are provided for allowing information on viscoelasticity of an adsorption substance to be expressed by moduli G′ and G″ which are generally used when expressing viscoelasticity, and for further allowing calculation of the viscoelastic modulus in real time. n [Solution] In a system for forming a film by adsorbing a substance to the surface of a piezoelectric element or to a film fixed onto the piezoelectric element in a solution, at least two of N-th waves of the piezoelectric element are used, and at least two of a resonance frequency F s , and half-value frequencies F 1 and F 2 (F 2 >F 1 ) having half conductance values of a conductance value of the resonance frequency in each N-th wave are used to calculate a mass load term, a viscoelastic term (1), a viscoelastic term (2), and a viscoelastic term (3), and to calculate viscoelastic moduli G′ (storage elastic modulus) and G″ (loss elastic modulus) of the film. |
| priorityDate |
2010-10-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |