http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2009038859-A1

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filingDate 2006-06-01-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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publicationDate 2009-02-12-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-2009038859-A1
titleOfInvention Measuring Method And Measuring Device Using Quartz Oscillator
abstract An object of the present invention is that any of mass load, viscous load and viscoelasticity load is measured separately from other load whereby properties of the substance to be measured are able to be measured correctly. n The characteristic feature of the present invention is that, in a method where property of a substance contacting to a quartz oscillator equipped with electrodes on both sides of a quartz plate is measured on the basis of the changes in frequency of the above quartz oscillator, the property of the above substance is measured using at least two frequencies among the n-th overtone mode frequency (n=1, 3, 5, . . . (n=2k+1)) of quartz oscillator when voltage is applied between the above electrodes and using frequencies F 1 , F 2 (F 1 <F 2 ) giving one half of the maximum value of conductance near the resonant point by each frequency.
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Total number of triples: 34.