| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_5a4f3b70d7173f35444555601c607cef
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_72f3904218170f7db29f3787c472fd30 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01J3-02
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01J3-0205
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-27
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01J3-0264
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01J3-427
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01J3-42
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-552 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01J3-44
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01J3-42
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01J3-02
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01J3-427
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-552 |
| filingDate |
2010-04-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
2015-05-26-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_7e178d4fe06b6660888db50786fbd8cd |
| publicationDate |
2015-05-26-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-9041923-B2 |
| titleOfInvention |
Peri-critical reflection spectroscopy devices, systems, and methods |
| abstract |
Spectroscopy apparatuses oriented to the critical angle of the sample are described that detecting the spectral characteristics of a sample wherein the apparatus consists of an electromagnetic radiation source adapted to excite a sample with electromagnetic radiation introduced to the sample at a location at an angle of incidence at or near a critical angle of the sample; a transmitting crystal in communication with the electromagnetic radiation source and the sample, the transmitting crystal having a high refractive index adapted to reflect the electromagnetic radiation internally; a reflector adapted to introduce the electromagnetic radiation to the sample at or near an angle of incidence near the critical angle between the transmitting crystal and sample; and a detector for detecting the electromagnetic radiation from the sample. Also, provided herein are methods, systems, and kits incorporating the peri-critical reflection spectroscopy apparatus. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11079327-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10806385-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10352770-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11412963-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9250182-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2009279773-A1 |
| priorityDate |
2009-04-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |