| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c6fdefc19f1b4d25cff44f4800f297a2
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_adb8eb234279223d3877c93c93d32519
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c5debe087d4a9fd9c03e035408c95e27
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_6b822ee046eb6c45d1e3bd9ce9c1782e |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10K71-861
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y10T428-31504 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10K71-70
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10K50-80
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10K71-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10K85-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10K50-844 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G09F9-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L51-52
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L51-50
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H05B33-12
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H05B33-10 |
| filingDate |
2010-05-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
2012-09-25-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0653e7c3ee56fd3545295fb38ddc9888
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_db0e0cbb923ade926a55a29ec3980cdc
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e92d92b7ce34a17f2a2b1acf9673cf14 |
| publicationDate |
2012-09-25-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-8273583-B2 |
| titleOfInvention |
Method of manufacturing a light emitting device and thin film forming apparatus |
| abstract |
A method of manufacturing a light emitting device is provided in which satisfactory image display can be performed by the investigation and repair of short circuits in defect portions of light emitting elements. A backward direction electric current flows in the defect portions if a reverse bias voltage is applied to the light emitting elements having the defect portions. Emission of light which occurred from the backward direction electric current flow is measured by using an emission microscope, specifying the position of the defect portions, and short circuit locations can be repaired by irradiating a laser to the defect portions, turning them into insulators. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2013044937-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8415174-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8687874-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2011027918-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9276231-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10177335-B2 |
| priorityDate |
2000-12-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |