| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_27e89a202d8948054af303cc9f31f000
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_570a304203f896c5b12ac7e93d6f4e45
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_b3a00902baf7157c2c4f7a90ec48b907
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_1644df5d54b2fbe9c5878b6e13271468 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2291-0256
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2291-0255
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2015-0046
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2015-0038
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2291-02425
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2291-02408
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2015-0261 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N29-222
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N15-0255
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N5-02
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N29-022 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01G9-00 |
| filingDate |
2008-02-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
2012-07-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_dcf85267e4451013d3eb2812d356d542
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a699306e8ef6640b77397dff66384889
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_41aecbbd6ac5f568679f5aad5ebd2542 |
| publicationDate |
2012-07-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-8225681-B2 |
| titleOfInvention |
Device for measuring superfine particle masses |
| abstract |
A device for measuring superfine particle masses including a quartz oscillator and an exposure system having at least two measuring chambers. Each of the at least two measuring chambers has a same geometry, a deposition surface for particles, and an aerosol feed directed at the respective disposition surface configured to feed an aerosol onto the respective deposition surface. At least one of the respective deposition surfaces is disposed on the quartz oscillator. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9726653-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11085861-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2020132671-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11054414-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9588105-B1 |
| priorityDate |
2007-03-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |