Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_bce787970b69aeb08d159e7c101c9ed7 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-28556 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-2855 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C23C16-45589 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C23C14-04 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C23C14-046 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76843 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C23C16-045 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76865 |
classificationIPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C23C16-44 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C23C16-04 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-4763 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-76 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C23C16-455 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-768 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-3205 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L23-52 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C23C14-04 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-285 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C23C14-34 |
filingDate |
2001-10-09-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
grantDate |
2006-10-03-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_7dba4b20c44d61c46974b3f3d5e235d0 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_259dd58266d7a94a55907e2d7970acc3 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b23fd7a7860a7797279de6e0e4a96d3a |
publicationDate |
2006-10-03-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
US-7115516-B2 |
titleOfInvention |
Method of depositing a material layer |
abstract |
A method of layer formation on a substrate with high aspect ratio features is disclosed. The layer is formed from a gas mixture comprising one or more process gases and one or more etch species. The one or more process gases react to deposit a material layer on the substrate. In conjunction with the material layer deposition, the etch species selectively remove portions of the deposited material layer adjacent to high aspect ratio feature openings, filling such features in a void-free and/or seam-free manner. The material layer may be deposited on the substrate using physical vapor deposition (PVD) and/or chemical vapor deposition (CVD) techniques. |
isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10395944-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9972504-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7772121-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9548228-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7776733-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10103058-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11069535-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2014017891-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2008274616-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9589835-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2008274624-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10256142-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10566211-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2006223322-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9653353-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9978610-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7589020-B2 |
priorityDate |
2001-10-09-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |