abstract |
A process for, and apparatus for, Chemically-Mechanically Polishing (CMP) a semiconductor wafer with a slurry including ElectroRheological (ER) and/or MagnetoRheological (MR) fluids. The combination of the materials and an electric field provides inherent tuning of polishing rates, locally and globally, and improves flatness and uniformity, as well as minimizing recession and erosion. |