http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-5903042-A

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_0e433c1625fc509a087c912b440da84b
classificationCPCAdditional http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2924-0002
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L23-5252
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L23-525
filingDate 1997-06-12-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 1999-05-11-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8f6d75612cb295bdd02380d85aac802d
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_817043d276d767945c66bd1f596abd0c
publicationDate 1999-05-11-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-5903042-A
titleOfInvention Self-aligned antifuse with base
abstract A method of integrating a low aspect ratio antifuse into low capacitance interconnect levels which involves fabrication of an antifuse base which is self-aligned to either a lower interconnect level or the antifuse dielectric. The method provides maximum allowable registration tolerance for the antifuse onto its base without incurring any increase in the pitch of the interconnect. The antifuse base is required to minimize the capacitance between the lower and upper interconnect levels. This is accomplished by providing over a lower interconnect pattern, such as, for example, aluminum over titanium tungstide (TiW), a barrier metal, such as, for example, TiW. The barrier metal separates one of the interconnect layers from the amorphous silicon dielectric. The barrier metal also acts as a raised base for the antifuse, providing increased spacing between the upper and lower interconnect patterns, thereby minimizing the capacitance therebetween.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-02067263-A3
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9105637-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2002003280-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-6774439-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7615813-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2004227260-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2008012057-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-02067263-A2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-6812542-B2
priorityDate 1996-06-19-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

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http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419491804
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419559477

Total number of triples: 27.