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classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76802
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-768
filingDate 1994-01-03-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 1995-05-30-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_bd79dd7f389e5baf7a4b35507bfbf167
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3b94fb0cf1a4e9b7c1714e2c09bfa396
publicationDate 1995-05-30-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-5420076-A
titleOfInvention Method of forming a contact for multi-level interconnects in an integrated circuit
abstract A via opening (24) is formed within a semiconductor structure (10) in order to allow for the insertion of a contact to establish multi-level interconnects in an integrated circuit. The via opening (24) extends to a conductive layer (16) within the semiconductor structure (10). During the formation of the via opening (24), a residual layer (26) is created within the via opening (24) and on the exposed surface of the conductive layer (16). A dry plasma material is introduced at the semiconductor structure (10) to remove the residual layer (26) from the via opening (24) and the exposed surface of the conductive layer (16). After removal of the residual layer (26), a conductive material for establishing the contact for connection to the conductive layer (16) is inserted within the via opening (24).
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priorityDate 1994-01-03-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 46.