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publicationDate 2020-05-07-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-2020144107-A1
titleOfInvention Method of forming barrier free contact for metal interconnects
abstract A method includes forming a first insulating layer having one or more vias formed in at least a portion of the first insulating layer. The vias are filled with a first metallic material. A cap layer is deposited on a top surface of the first insulating layer and a top surface of the one or more vias and a second insulating layer is deposited on a top surface of the cap layer. One or more openings are formed in the second insulating layer and the cap layer. A self-assembled monolayer is formed on an exposed top surface of the first metallic material in the one or more vias. A barrier layer is formed on at least the exposed surface of the one or more openings. The self-assembled monolayer is removed and the one or more openings are filled with a second metallic material.
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