http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2017317210-A1

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filingDate 2016-04-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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publicationDate 2017-11-02-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-2017317210-A1
titleOfInvention Vertical fet structure
abstract Techniques relate to forming a vertical field effect transistor (FET). One or more fins are formed on a bottom source or drain of a substrate, and one or more fins extend in a vertical direction. Gate material is formed to be positioned on sides of the one or more fins. Gate encapsulation material is formed on sides of the gate material to form a trench, such that top portions of the one or more fins are exposed in the trench. A top source or drain is formed on top of the one or more fins such that the top source or drain is laterally confined by the trench in a lateral direction that is parallel to the one or more fins.
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Total number of triples: 40.